Yihong Wu, Ying Wang, Jiayi Wang, Miao Zhou, Aihua Zhang, Chun Zhang, Yanjing Yang, Younan Hua, Baoxi Xu
Metal/two-dimensional carbon junctions are characterized by using a nanoprobe
in an ultrahigh vacuum environment. Significant differences were found in bias
voltage (V) dependence of differential conductance (dI/dV) between edge- and
side-contact; the former exhibits a clear linear relationship (i.e., dI/dV
\propto V), whereas the latter is characterized by a nonlinear dependence,
dI/dV \propto V3/2. Theoretical calculations confirm the experimental results,
which are due to the robust two-dimensional nature of the carbon materials
under study. Our work demonstrates the importance of contact geometry in
graphene-based electronic devices.
View original:
http://arxiv.org/abs/1202.0615
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