Friday, February 24, 2012

1202.5217 (Daniel Platz et al.)

The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy    [PDF]

Daniel Platz, Daniel Forchheimer, Erik A. Tholén, David B. Haviland
Various methods of force measurement with the Atomic Force Microscope (AFM)
are compared for their ability to accurately determine the tip-surface force
from analysis of the nonlinear cantilever motion. It is explained how
intermodulation, or the frequency mixing of multiple drive tones by the
nonlinear tip-surface force, can be used to concentrate the nonlinear motion in
a narrow band of frequency near the cantilevers fundamental resonance, where
accuracy and sensitivity of force measurement are greatest. Two different
methods for reconstructing tip-surface forces from intermodulation spectra are
explained. The reconstruction of both conservative and dissipative tip-surface
interactions from intermodulation spectra are demonstrated on simulated data.
View original: http://arxiv.org/abs/1202.5217

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