1101.4709 (E. Iyoda et al.)

Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall
Edge States    [PDF]

E. Iyoda, T. Fujii

We investigate shot noise at {\it finite temperatures} induced by the quasi-particle tunneling between fractional quantum Hall (FQH) edge states. The resulting Fano factor has the peak structure at a certain bias voltage. Such a structure indicates that quasi-particles are weakly {\it glued} due to thermal fluctuation. We show that the effect makes it possible to probe the difference of statistics between $\nu=1/5,{}2/5$ FQH states where quasi-particles have the same unit charge.Finally we propose a way to indirectly obtain statistical angle in hierarchical FQH states.

View original: http://arxiv.org/abs/1101.4709