Thursday, April 4, 2013

1304.0955 (A. G. Touryanski et al.)

Investigation of quantum-dimensional structure parameters by X-ray
optical, scanning tunneling and transmission electron microscopy
   [PDF]

A. G. Touryanski, V. M. Senkov, S. S. Gizha, L. V. Arapkina, V. A. Chapnin, K. V. Chizh, V. P. Kalinushkin, M. S. Storozhevykh, O. V. Uvarov, V. A. Yuryev
Application of the two-wavelength X-ray reflectometry to exploration of Ge/Si(001) hereostructures with dense chains of stacked Ge quantum dots is presented
View original: http://arxiv.org/abs/1304.0955

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