Tuesday, July 10, 2012

1207.2058 (Axel Eckmann et al.)

Probing the Nature of Defects in Graphene by Raman Spectroscopy    [PDF]

Axel Eckmann, Alexandre Felten, Artem Mishchenko, Liam Britnell, Ralph Krupke, Kostya S. Novoselov, Cinzia Casiraghi
Raman Spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D' peak is maximum (~ 13) for sp3-defects, it decreases for vacancy-like defects (~ 7) and reaches a minimum for boundaries in graphite (~3.5).
View original: http://arxiv.org/abs/1207.2058

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