1303.2134 (Daniel Forchheimer et al.)

Simultaneous quantitative imaging of surface and magnetic forces    [PDF]

Daniel Forchheimer, Daniel Platz, Erik A. Tholen, David B. Haviland

We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are separated from near-surface forces at the 30 nN level. Imaging of these forces is performed in both the contact and non-contact regimes of near-surface interactions.

View original: http://arxiv.org/abs/1303.2134