1301.7490 (Mohammad Salehi Fashami et al.)

Switching of dipole coupled multiferroic nanomagnets in the presence of
thermal noise: reliability analysis of hybrid spintronic-straintronic
nanomagnetic logic    [PDF]

Mohammad Salehi Fashami, Kamaram Munira, Supriyo Bandyopadhyay, Avik W Ghosh, Jayasimha Atulasimha

The stress-induced switching behavior of a multiferroic nanomagnet, dipole coupled to a hard nanomagnet, is numerically studied by solving the stochastic Landau-Lifshitz (LL) equation for a single domain macro-spin state. Different factors were found to affect the switching probability in the presence of thermal noise at room temperature: (i) dipole coupling strength, (ii) stress levels, and (iii) stress withdrawal rates (ramp rates). We report that the thermal broadening of the magnetization distribution causes large errors in switching. This could become the bane of nanomagnetic logic schemes that rely on dipole coupling to perform Boolean logic operations.

View original: http://arxiv.org/abs/1301.7490