Friday, July 5, 2013

1307.1457 (E. S. Sadki et al.)

Temperature Dependence of the Electrical Transport Properties of
Multilayer Graphene

E. S. Sadki, H. Okazaki, T. Watanabe, T. Yamaguchi, Y. Takano
Multilayer graphene (MLG) thin films are deposited on silicon oxide substrates by mechanical exfoliation (or 'scotch-tape method') from Kish graphite. The thickness and number of layers are determined from both Atomic Force Microscopy (AFM) and Raman Spectroscopy. Electrical terminals are deposited on MLGs in a four-probe configuration by electron-beam lithography, gold/titanium thermal evaporation, and lift-off. The electrical resistance is measured from room temperature down to 2 K. The electrical resistance of the MLGs shows an increase with decreasing temperature, and then decreases after reaching a maximum value. These results are compared with recent experimental and theoretical data from the literature.
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